IC TestIC Test
They say that testing IC is a kind of "black magic"...
Silis benefits from the collaboration with the University of Parma and the precious experience of senior test engineers who proofed their skills in IC characterization. We are able to set up delicate test-bench as complex as, for instance, high speed high resolution A/D converters, serializer/deserializer, ...
The experience of Silis' test engineers is fully exploited thanks to the essential lab support of our designer who developed the IC under test.
Test services ranges from high performance PCB design to manufacturing support, from test-bench setup to accurate measurements.
Our measurements include:
- data conversion IC, i.e. high speed, high resolution ADC/DAC, up to 1 Gsps
- high speed communication IC, i.e. LVDS, SerDes, line drivers, up to 3 GHz (jitter measurements, eye diagrams, ...)
- RF circuits up to 20 GHz (with microprobes for die and wafer level signal sensing)
- general purpose circuits
- flicker noise analysis
- measurements at different temperatures
Save time, budget and risk exposure by committing both IC design and characterization to Silis!